Atomic Force Microscopy — Multimode 8HR with NanoScope
The MultiMode AFM/STM with Contact Mode, Tapping Mode, Peakforce Tapping Technology, and Scanning Tunneling Microscopy (STM) capabilities.
Microscopy and imaging facility
Instruments
Cressington, 108 auto/SE Automatic Sputter Coater with Gold target
Used for standard SEM / EDX applications.
Imaging Ellipsometer / Brewster Angle Microscope
Set-up for solid or liquid substrates.
Optical microscope
Configuration for fluorescence and polarized light microscopy of liquid and solid surfaces.
Phenom ProX Scanning Electron Microscope (SEM) with EDS capability
The super-fast, high-resolution Scanning Electron Microscope with integrated energy-dispersive X-ray diffraction (EDS) detector for robust, easy-to-use, rapid elemental analysis.
Talos™ L120C (Scanning) Transmission Electron Microscope (STEM) for Materials Science with integrated EDS detector
The 20-120 kV Scanning Transmission Electron Microscope (STEM) with integrated EDS detector that facilitates Brightfield (BF) and Dark field (DF) imaging in TEM & STEM, Electron diffraction (ED) in TEM, Selected area electron diffraction (SAED) in TEM, Convergent beam diffraction (CBD) in TEM and HRTEM (operating reflection) in TEM.