Atomic Force Microscopy — Multimode 8HR with NanoScope
The MultiMode AFM/STM with Contact Mode, Tapping Mode, Peakforce Tapping Technology, and Scanning Tunneling Microscopy (STM) capabilities.
Surface characterization facility
Instruments
Imaging Ellipsometer / Brewster Angle Microscope
Set-up for solid or liquid substrates.
Langmuir and Langmuir-Blodgett Film Balances
Coupled to either fluorescence microscope or Imaging Ellipsometer/Brewster angle microscope.
Optical microscope
Configuration for fluorescence and polarized light microscopy of liquid and solid surfaces.
Profile Analysis Tensiometer
For dynamic surface tension, surface rheology and contact angle measurements including subphase exchanger and controlled atmosphere/humidity chamber.